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Mahapatra, Souvik
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Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling edited by Souvik Mahapatra.
Published 2016
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Recent advances in PMOS negative bias temperature instability : characterization and modeling of device architecture, material and process impact Souvik Mahapatra, editor.
Published 2022
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Related Subjects
Effect of temperature on
Electronic circuits
Electronic resources (E-books)
Electronics
Metal oxide semiconductors, Complementary
Microelectronics
Reliability
Solid state physics