Multiple-beam interferometry of surfaces and films.

Multiple-beam interferometry of surfaces and films.

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Bibliographic Details
Main Author:	Tolansky, S. (Samuel), 1907-1973
Format:	Book
Language:	English
Published:	Oxford, Clarendon Press, 1948.
Series:	Monographs on the physics and chemistry of materials.
Subjects:	Interferometers. Surfaces (Technology) Metallography.

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