Measuring intelligence: a guide to the administration of the new revised Stanford-Binet tests of intelligence, by Lewis M. Terman and Maud A. Merrill.

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Bibliographic Details
Main Author:	Terman, Lewis Madison, 1877-1956
Other Authors:	Merrill, Maud A. (Maud Amanda), 1888-1985
Format:	Book
Language:	English
Published:	Boston, New York [etc.] Houghton Mifflin company [c1937]
Series:	Riverside textbooks in education.
Subjects:	Educational tests and measurements.

Description
Physical Description:	xi, [1] p., 2 l., [3]-460, [1] p. incl. illus., tables, diagrs. 21 cm.

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