Design to test : a definitive guide for electronic design, manufacture, and service / Jon Turino.

Saved in:

Bibliographic Details
Main Author:	Turino, Jon L.
Format:	Book
Language:	English
Published:	New York, N.Y. : Van Nostrand Reinhold, c1990.
Edition:	2nd ed.
Subjects:	Integrated circuits > Testing.

Holdings details from Science Library
Call Number:	TK7874 .T83 1990
Copy 1	Available

Similar Items