X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by Martin Schmidbauer.

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevanc...

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Bibliographic Details
Main Author: Schmidbauer, Martin. (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2004.
Edition:1st ed. 2004.
Series:Springer Tracts in Modern Physics, 199
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