Testing and Reliable Design of CMOS Circuits by Niraj K. Jha, Sandip Kundu.

In the last few years CMOS technology has become increas­ ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den­ sity and low power requirement. The ability to realize very com­ plex circuits on a single chip has brought ab...

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Bibliographic Details
Main Authors: Jha, Niraj K. (Author), Kundu, Sandip (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1990.
Edition:1st ed. 1990.
Series:The Springer International Series in Engineering and Computer Science, 88
Springer eBook Collection.
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Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
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