Material Characterization Using Ion Beams

Material Characterization Using Ion Beams edited by J. Thomas.

The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physic...

Full description

Saved in:
Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Thomas, J. (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1978.
Edition:1st ed. 1978.
Series:Nato Science Series B:, Physics, 28
Springer eBook Collection.
Subjects:
Solid state physics.
Spectroscopy.
Microscopy.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • I Ion Beams: Production and Interaction with Matter
  • Energy Loss of Charged Particles
  • Some General Considerations of Ion Beam Production and Manipulation
  • II Surface Studies: keV Range Ions
  • Applications of Low-Energy Ion Scattering
  • Ion Beam Induced Light Emission: Mechanisms and Analytical Applications
  • Complementary Analysis Techniques: AES, ESCA
  • III In-Depth Analysis
  • Fundamental Aspects of Ion Microanalysis
  • Ion Induced X-rays: General Description
  • The Evolving Use of Electrons, Protons and Heavy Ions in the Characterisation of Materials
  • Backscattering of Ions With Intermediate Energies
  • Backscattering Analysis With MeV 4He Ions
  • Microanalysis by Direct Observation of Nuclear Reactions
  • IV Solid State Studies Using Channeling Effects
  • Channeling: General Description
  • Flux Peaking — Lattice Location
  • Analysis of Defects by Channeling
  • Application of MeV Ion Channeling to Surface Studies
  • General Conclusions
  • General Conclusions
  • Participants.

Similar Items