Nondestructive Materials Characterization With Applications to Aerospace Materials

Nondestructive Materials Characterization With Applications to Aerospace Materials / edited by Norbert G. H. Meyendorf, Peter B. Nagy, Stanislav I. Rokhlin.

With an emphasis on aircraft materials, this book describes techniques for the material characterization to detect and quantify degradation processes such as corrosion and fatigue. It introduces readers to these techniques based on x-ray, ultrasonic, optical and thermal principles and demonstrates t...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Meyendorf, Norbert G. H. (Editor), Nagy, Peter B. (Editor), Rokhlin, Stanislav I. (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2004.
Edition:1st ed. 2004.
Series:Springer Series in Materials Science, 67
Springer eBook Collection.
Subjects:
Condensed matter.
Materials—Surfaces.
Thin films.
Materials science.
Engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • 1 Degradation of Aircraft Structures
  • 2 Optical Detection of Surface Damage
  • 3 Microradiographic and Foil Penetration Methods for Quantification of Localized Corrosion
  • 4 Interferometric and Holographic Imaging of Surface Wave Patterns for Characterization of Material Degradation
  • 5 Surface Acoustic Wave Characterization of Pitting Corrosion Damage with Fatigue Crack
  • 6 Ultrasonic Fatigue Crack Detection in Aluminum and Titanium Alloys
  • 7 Early Detection of Fatigue Damage in Ti-6A1-4V with Nonlinear Acoustics
  • 8 Ultrasonic Absorption Measurements
  • 9 Thermographic Materials Characterization
  • 10 Scanning Vibrating Electrode Technique as a Benchmark for NDE of Corrosion
  • 11 Acoustic Imaging Techniques for Characterization of Corrosion, Corrosion Protective Coatings, and Surface Cracks
  • 12 Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy
  • 13 High Resolution Microellipsometry
  • 14 Positron Annihilation Spectroscopy (PAS).

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