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|a 10.1007/978-3-662-07766-5
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|a High-Resolution Imaging and Spectrometry of Materials
|h [electronic resource] /
|c edited by Frank Ernst, Manfred Rühle.
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| 250 |
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|a 1st ed. 2003.
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| 264 |
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1 |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2003.
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| 300 |
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|a XIV, 442 p.
|b online resource.
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|a Springer Series in Materials Science,
|x 0933-033X ;
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|a Springer eBook Collection
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|a 1 Microcharacterisation of Materials -- 2 Electron Scattering -- 3 Structure Determination by Quantitative High-Resolution Electron Microscopy (Q-HRTEM) -- 4 Quantitative Analytical Transmission Electron Microscopy -- 5 Advances in Electron Optics -- 6 Tomography by Atom Probe Field Ion Microscopy -- 7 Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM) -- 8 Multi-Method High-Resolution Surface Analysis with Slow Electrons -- 9 From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites -- 10 Microstructural Characterization of Materials: An Assessment.
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| 520 |
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|a This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
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| 590 |
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|a Loaded electronically.
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| 590 |
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|a Electronic access restricted to members of the Holy Cross Community.
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| 650 |
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0 |
|a Materials—Surfaces.
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| 650 |
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0 |
|a Thin films.
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| 650 |
|
0 |
|a Solid state physics.
|
| 650 |
|
0 |
|a Spectroscopy.
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| 650 |
|
0 |
|a Microscopy.
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| 650 |
|
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|a Materials science.
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| 650 |
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|a Physical chemistry.
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| 690 |
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|a Electronic resources (E-books)
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|a Ernst, Frank.
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|a Rühle, Manfred.
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| 710 |
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|a Springer Series in Materials Science,
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