High-Resolution Imaging and Spectrometry of Materials

High-Resolution Imaging and Spectrometry of Materials edited by Frank Ernst, Manfred Rühle.

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from rese...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Ernst, Frank (Editor), Rühle, Manfred (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2003.
Edition:1st ed. 2003.
Series:Springer Series in Materials Science, 50
Springer eBook Collection.
Subjects:
Materials—Surfaces.
Thin films.
Solid state physics.
Spectroscopy.
Microscopy.
Materials science.
Physical chemistry.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • 1 Microcharacterisation of Materials
  • 2 Electron Scattering
  • 3 Structure Determination by Quantitative High-Resolution Electron Microscopy (Q-HRTEM)
  • 4 Quantitative Analytical Transmission Electron Microscopy
  • 5 Advances in Electron Optics
  • 6 Tomography by Atom Probe Field Ion Microscopy
  • 7 Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM)
  • 8 Multi-Method High-Resolution Surface Analysis with Slow Electrons
  • 9 From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites
  • 10 Microstructural Characterization of Materials: An Assessment.

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