Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics

Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics by Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli.

This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since i...

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Bibliographic Details
Main Authors: Brayton, Robert K. (Author), Sangiovanni-Vincentelli, Alberto L. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2001.
Edition:1st ed. 2001.
Series:Springer eBook Collection.
Subjects:
Electronic circuits.
Electrical engineering.
Computer-aided engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
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Call Number: E-Book
Status: Available

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