Surface and Interface Characterization by Electron Optical Methods edited by Ugo Valdre.

The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Valdre, Ugo (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1988.
Edition:1st ed. 1988.
Series:Nato ASI Subseries B:, Physics ; 16
Springer eBook Collection.
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