Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques

Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques / edited by Roland Wiesendanger, Hans-Joachim Güntherodt.

Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry...

Full description

Saved in:
Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Wiesendanger, Roland (Editor), Güntherodt, Hans-Joachim (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1992.
Edition:1st ed. 1992.
Series:Springer Series in Surface Sciences, 28
Springer eBook Collection.
Subjects:
Solid state physics.
Spectroscopy.
Microscopy.
Materials—Surfaces.
Thin films.
Cell biology.
Physical chemistry.
Engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • 1. Introduction
  • 1.1 STM in Electrochemistry and Biology
  • 1.2 Probing Small Forces on a Small Scale
  • 1.3 Related Scanning Probe Microscopies
  • 1.4 Nanotechnology
  • References
  • 2. STM in Electrochemistry
  • 2.1 Principal Aspects
  • 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes
  • 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes
  • 2.4 Outlook
  • References
  • 3. The Scanning Tunneling Microscope in Biology
  • 3.1 Instrumentation
  • 3.2 Processing of STM Images
  • 3.3 Preparation
  • 3.4 Applications
  • 3.5 Imaging and Conduction Mechanisms
  • 3.6 Conclusions
  • References
  • 4. Scanning Force Microscopy (SFM)
  • 4.1 Experimental Aspects of Force Microscopy
  • 4.2 Forces and Their Relevance to Force Microscopy
  • 4.3 Microscopic Description of the Tip—Sample Contact
  • 4.4 Imaging with the Force Microscope
  • 4.5 Conclusions and Outlook
  • References
  • 5. Magnetic Force Microscopy (MFM)
  • 5.1 Basic Principles of MFM
  • 5.2 Measurement Techniques
  • 5.3 Force Sensors
  • 5.4 Theory of MFM Response
  • 5.5 Imaging Data Storage Media
  • 5.6 Imaging Soft Magnetic Materials
  • 5.7 Resolution
  • 5.8 Separation of Magnetic and Topographic Signals
  • 5.9 Comparison with Other Magnetic Imaging Techniques
  • 5.10 Conclusions and Outlook
  • References
  • 6. Related Scanning Techniques
  • 6.1 Historical Background
  • 6.2 STM and Electrical Measurements
  • 6.3 STM and Optical Effects
  • 6.4 Near-Field Thermal Microscopy
  • 6.5 Scanning Force Microscopy and Extensions
  • 6.6 Conclusion
  • References
  • 7. Nano-optics and Scanning Near-Field Optical Microscopy
  • 7.1 Nano-optics: Optics of Nanometer-Size Structures
  • 7.2 Experimental Work
  • 7.3 Plasmons and Spectroscopic Effects
  • 7.4 Imaging by SNOM
  • 7.5 Discussion, Outlook, Conclusions
  • References
  • 8. Surface Modification with a Scanning Proximity Probe Microscope
  • 8.1 Overview
  • 8.2 Microfabrication with a Scanning Probe Microscope
  • 8.3 Investigation of the Fabrication Process
  • 8.4 Review of SXM Lithography
  • References.

Similar Items