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|a 9783662045169
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|a 10.1007/978-3-662-04516-9
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|a (DE-He213)978-3-662-04516-9
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|a Fultz, Brent.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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| 245 |
1 |
0 |
|a Transmission Electron Microscopy and Diffractometry of Materials
|h [electronic resource] /
|c by Brent Fultz, James M. Howe.
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| 250 |
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|a 1st ed. 2001.
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| 264 |
|
1 |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2001.
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| 300 |
|
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|a XIX, 748 p.
|b online resource.
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| 336 |
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|a text
|b txt
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|b PDF
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|a Springer eBook Collection
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| 505 |
0 |
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|a 1. Diffraction and the X-Ray Powder Diffractometer -- 2. The TEM and its Optics -- 3. Scattering -- 4. Inelastic Electron Scattering and Spectroscopy -- 5. Diffraction from Crystals -- 6. Electron Diffraction and Crystallography -- 7. Diffraction Contrast in TEM Images -- 8. Diffraction Lineshapes -- 9. Patterson Functions and Diffuse Scattering -- 10. High-Resolution TEM Imaging -- 11. Dynamical Theory -- Further Reading -- References and Figures -- A. Appendix -- A.1 Indexed Powder Diffraction Patterns -- A.3 Mass Attenuation Coefficients for Characteristic K?? X-Rays -- A.3 Atomic Form Factors for X-Rays -- A.4 X-Ray Dispersion Corrections for Anomalous Scattering -- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages -- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp -- A.7 Stereographic Projections -- A.8 Examples of Fourier Transforms -- A.10 Numerical Approximation for the Voigt Function -- A.11 Debye-Waller Factor from Wave Amplitude -- A.12 Review of Dislocations -- A.13 TEM Laboratory Exercises -- A.13.1 Preliminary — JEOL 2000FX Daily Operation -- A.13.2 Preliminary — Philips 400T Daily Operation -- A.13.6 Laboratory 4 — Contrast Analysis of Defects -- A.14 Fundamental and Derived Constants.
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| 520 |
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|a This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.
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| 590 |
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|a Loaded electronically.
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| 590 |
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|a Electronic access restricted to members of the Holy Cross Community.
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| 650 |
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0 |
|a Spectroscopy.
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| 650 |
|
0 |
|a Microscopy.
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| 650 |
|
0 |
|a Surfaces (Physics).
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| 650 |
|
0 |
|a Interfaces (Physical sciences).
|
| 650 |
|
0 |
|a Thin films.
|
| 650 |
|
0 |
|a Solid state physics.
|
| 650 |
|
0 |
|a Materials—Surfaces.
|
| 690 |
|
|
|a Electronic resources (E-books)
|
| 700 |
1 |
|
|a Howe, James M.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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| 710 |
2 |
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|a SpringerLink (Online service)
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|a Springer eBook Collection.
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|u https://holycross.idm.oclc.org/login?auth=cas&url=https://doi.org/10.1007/978-3-662-04516-9
|3 Click to view e-book
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