Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe.

This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif-...

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Bibliographic Details
Main Authors: Fultz, Brent (Author), Howe, James M. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2001.
Edition:1st ed. 2001.
Series:Springer eBook Collection.
Subjects:
Spectroscopy.
Microscopy.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Solid state physics.
Materials—Surfaces.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • 1. Diffraction and the X-Ray Powder Diffractometer
  • 2. The TEM and its Optics
  • 3. Scattering
  • 4. Inelastic Electron Scattering and Spectroscopy
  • 5. Diffraction from Crystals
  • 6. Electron Diffraction and Crystallography
  • 7. Diffraction Contrast in TEM Images
  • 8. Diffraction Lineshapes
  • 9. Patterson Functions and Diffuse Scattering
  • 10. High-Resolution TEM Imaging
  • 11. Dynamical Theory
  • Further Reading
  • References and Figures
  • A. Appendix
  • A.1 Indexed Powder Diffraction Patterns
  • A.3 Mass Attenuation Coefficients for Characteristic K?? X-Rays
  • A.3 Atomic Form Factors for X-Rays
  • A.4 X-Ray Dispersion Corrections for Anomalous Scattering
  • A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages
  • A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp
  • A.7 Stereographic Projections
  • A.8 Examples of Fourier Transforms
  • A.10 Numerical Approximation for the Voigt Function
  • A.11 Debye-Waller Factor from Wave Amplitude
  • A.12 Review of Dislocations
  • A.13 TEM Laboratory Exercises
  • A.13.1 Preliminary — JEOL 2000FX Daily Operation
  • A.13.2 Preliminary — Philips 400T Daily Operation
  • A.13.6 Laboratory 4 — Contrast Analysis of Defects
  • A.14 Fundamental and Derived Constants.

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