Microelectronics Manufacturing Diagnostics Handbook by Abraham Landzberg.

The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi­ control techniques, test, diagnostics, and fail­ ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining op...

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Bibliographic Details
Main Author: Landzberg, Abraham (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 1993.
Edition:1st ed. 1993.
Series:Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • 1 Introduction
  • 2 Manufacturing Yield
  • 3 Problem Diagnostics
  • 4 Manufacturing Defect Classification System
  • 5 Product Dimensional Metrology and Pattern Defect Inspection
  • 6 Process and Tool Monitoring
  • 7 Contamination Monitoring
  • 8 Repair and Rework
  • 9 Test Sites and Vehicles For Yield and Process Monitoring
  • 10 In-Line Electrical Test
  • 11 Final Test
  • 12 Traceability
  • 13 Failure Analysis of Semiconductor Dvices
  • 14 Materials and Chemical Analysis of Electronic Devices
  • 15 Modeling for Manufacturing Diagnostics
  • 16 Artificial Intelligence Techniques for Analysis: Expert Systems and Neural Networks
  • 17 Statistical Quality Control
  • 18 Reliability/Defect Severity
  • 19 Burn-In
  • 20 Defect Prevention.