|
|
|
|
LEADER |
00000nam a22000005i 4500 |
001 |
b3241362 |
003 |
MWH |
005 |
20191028081038.0 |
007 |
cr nn 008mamaa |
008 |
130409s2002 ja | s |||| 0|eng d |
020 |
|
|
|a 9784431669883
|
024 |
7 |
|
|a 10.1007/978-4-431-66988-3
|2 doi
|
035 |
|
|
|a (DE-He213)978-4-431-66988-3
|
050 |
|
4 |
|a E-Book
|
072 |
|
7 |
|a PHF
|2 bicssc
|
072 |
|
7 |
|a SCI077000
|2 bisacsh
|
072 |
|
7 |
|a PHF
|2 thema
|
100 |
1 |
|
|a Shindo, DAISUKE.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
|
245 |
1 |
0 |
|a Analytical Electron Microscopy for Materials Science
|h [electronic resource] /
|c by DAISUKE Shindo, T. Oikawa.
|
250 |
|
|
|a 1st ed. 2002.
|
264 |
|
1 |
|a Tokyo :
|b Springer Japan :
|b Imprint: Springer,
|c 2002.
|
300 |
|
|
|a IX, 152 p. 106 illus.
|b online resource.
|
336 |
|
|
|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a computer
|b c
|2 rdamedia
|
338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
347 |
|
|
|a text file
|b PDF
|2 rda
|
490 |
1 |
|
|a Springer eBook Collection
|
505 |
0 |
|
|a 1. Basic Principles of Analytical Electron Microscopy -- 2. Constitution and Basic Operation of Analytical Electron Microscopes -- 3. Electron Energy-Loss Spectroscopy -- 4. Energy Dispersive X-ray Spectroscopy -- 5. Peripheral Instruments and Techniques for Analytical Electron Microscopy -- Appendix A: Physical Constants, Conversion Factors, Electron Wavelengths -- Appendix B: Electron Binding Energies and Characteristic X-ray Energies -- Appendix C. Vacuum System.
|
520 |
|
|
|a Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
|
590 |
|
|
|a Loaded electronically.
|
590 |
|
|
|a Electronic access restricted to members of the Holy Cross Community.
|
650 |
|
0 |
|a Condensed matter.
|
690 |
|
|
|a Electronic resources (E-books)
|
700 |
1 |
|
|a Oikawa, T.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
|
710 |
2 |
|
|a SpringerLink (Online service)
|
773 |
0 |
|
|t Springer eBooks
|
830 |
|
0 |
|a Springer eBook Collection.
|
856 |
4 |
0 |
|u https://holycross.idm.oclc.org/login?auth=cas&url=https://doi.org/10.1007/978-4-431-66988-3
|3 Click to view e-book
|t 0
|
907 |
|
|
|a .b32413622
|b 04-18-22
|c 02-26-20
|
998 |
|
|
|a he
|b 02-26-20
|c m
|d @
|e -
|f eng
|g ja
|h 0
|i 1
|
912 |
|
|
|a ZDB-2-PHA
|
912 |
|
|
|a ZDB-2-BAE
|
950 |
|
|
|a Physics and Astronomy (Springer-11651)
|
902 |
|
|
|a springer purchased ebooks
|
903 |
|
|
|a SEB-COLL
|
945 |
|
|
|f - -
|g 1
|h 0
|j - -
|k - -
|l he
|o -
|p $0.00
|q -
|r -
|s b
|t 38
|u 0
|v 0
|w 0
|x 0
|y .i21545273
|z 02-26-20
|
999 |
f |
f |
|i c51eed0b-0b53-57e2-afe6-54ecc9478179
|s 71c10a62-8bb1-51c2-b7a3-cdf9dd3ae5b6
|t 0
|
952 |
f |
f |
|p Online
|a College of the Holy Cross
|b Main Campus
|c E-Resources
|d Online
|t 0
|e E-Book
|h Library of Congress classification
|i Elec File
|