Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials

Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.

The book deals with lock-in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady-state thermography, the lock-in mode enables a much improved signal/noise ratio (up to 1000x) by signal averaging, a far...

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Bibliographic Details
Main Authors: Breitenstein, Otwin (Author), Warta, Wilhelm (Author), Langenkamp, Martin (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2003.
Edition:1st ed. 2003.
Series:Springer Series in Advanced Microelectronics, 10
Springer eBook Collection.
Subjects:
Electronics.
Microelectronics.
Physical measurements.
Measurement   .
Optical materials.
Electronic materials.
Nanotechnology.
Engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.

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