Atomic Force Microscopy

Atomic Force Microscopy by Bert Voigtländer.

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...

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Bibliographic Details
Main Author: Voigtländer, Bert (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:2nd ed. 2019.
Series:NanoScience and Technology,
Springer eBook Collection.
Subjects:
Spectroscopy.
Microscopy.
Nanotechnology.
Nanoscale science.
Nanoscience.
Nanostructures.
Electronic resources (E-books)
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Call Number: E-Book
Status: Available

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