Atomic Force Microscopy by Bert Voigtländer.

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015)...

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Bibliographic Details
Main Author:	Voigtländer, Bert (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:	2nd ed. 2019.
Series:	NanoScience and Technology, Springer eBook Collection.
Subjects:	Spectroscopy. Microscopy. Nanotechnology. Nanoscale science. Nanoscience. Nanostructures. Electronic resources (E-books)
Online Access:	Click to view e-book
Holy Cross Note:	Loaded electronically. Electronic access restricted to members of the Holy Cross Community.

Table of Contents:

Introduction
Part I: Scanning Probe Microscopy Instrumentation
Harmonic Oscillator
Technical Aspects of Scanning Probe Microscopy
Scanning Probe Microscopy Designs
Electronics for Scanning Probe Microscopy
Lock-In Technique
Data Representation and Image Processing
Artifacts in SPM
Work Function, Contact Potential, and Kelvin Probe
Part II: Atomic Force Microscopy (AFM)
Forces between Tip and Sample
Technical Aspects of Atomic Force Microscopy
Static Atomic Force Microscopy
Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
Intermittent Contact Mode/Tapping Mode
Mapping of Mechanical Properties Using Force-Distance
Frequency Modulation (FM) Mode in Dynamic Atomic Force
Noise in Atomic Force Microscopy
Quartz Sensors in Atomic Force Microscopy.

Atomic Force Microscopy by Bert Voigtländer.

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