Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications and Optical Data of Solar Cell Materials

Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications and Optical Data of Solar Cell Materials / edited by Hiroyuki Fujiwara, Robert W. Collins.

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Fujiwara, Hiroyuki (Editor), Collins, Robert W. (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Springer Series in Optical Sciences, 214
Springer eBook Collection.
Subjects:
Lasers.
Photonics.
Optical materials.
Electronic materials.
Spectroscopy.
Microscopy.
Renewable energy resources.
Microwaves.
Optical engineering.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • Introduction
  • Part I: Application of Ellipsometry Technique
  • Analysis of Optical and Recombination Losses in Solar Cells
  • Optical Simulation of External Quantum Efficiency Spectra
  • Characterization of Textured Structures
  • On-line Monitoring of Photovoltaics Production
  • Real Time Measurement, Monitoring, and Control of CuIn1‑xGaxSe2 by Spectroscopic Ellipsometry
  • Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells
  • Part II: Optical Data of Solar-Cell Component Materials
  • Inorganic Semiconductors and Passivation Layers
  • Organic Semiconductors
  • Organic-Inorganic Hybrid Perovskites
  • Transparent Conductive Oxides
  • Metals
  • Substrates and Coating Layers.

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