Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization / edited by Hiroyuki Fujiwara, Robert W. Collins.

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid per...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Fujiwara, Hiroyuki (Editor), Collins, Robert W. (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Springer Series in Optical Sciences, 212
Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • Introduction
  • Part I: Fundamental Principles of Ellipsometry
  • Measurement Technique of Ellipsometry
  • Data Analysis
  • Optical Properties of Semiconductors
  • Dielectric Function Modeling
  • Effect of Roughness on Ellipsometry Analysis
  • Part II: Characterization of Materials and Structures
  • Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon
  • Crystalline Silicon Solar Cells
  • Amorphous/Crystalline Si Heterojunction Solar Cells
  • Optical Properties of Cu(In,Ga)Se2
  • Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization
  • Cu2ZnSn(S,Se)4 and Related Materials
  • Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics
  • High Efficiency III-V Solar Cells
  • Organic Solar Cells
  • Organic-Inorganic Hybrid Perovskite Solar Cells
  • Solar Cells with Photonic and Plasmonic Structures
  • Transparent Conductive Oxide Materials
  • High-Mobility Transparent Conductive Oxide Layers.