Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry

Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry / edited by C. Barry Carter, David B. Williams.

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Carter, C. Barry (Editor), Williams, David B. (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edition:1st ed. 2016.
Series:Springer eBook Collection.
Subjects:
Materials science.
Nanoscale science.
Nanoscience.
Nanostructures.
Spectroscopy.
Solid state physics.
Microscopy.
Mechanics.
Mechanics, Applied.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • Foreword by Sir John Meurig Thomas
  • 1. Electron Sources
  • 2. In Situ and Operando
  • 3. Electron Diffraction and Phase Identification
  • 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns
  • 5. Electron crystallography, charge-density mapping and nanodiffraction
  • 6. Digital Micrograph
  • 7. Electron waves, interference & coherence
  • 8. Electron Holography
  • 9. Focal-Series Reconstruction
  • 10. Direct Methods For Image Interpretation
  • 11. Imaging in the STEM
  • 12. Electron Tomography
  • 13. Energy-Filtered Transmission Electron Microscopy
  • 14. Calculation of Electron Energy-Loss Spectra
  • 15. Electron Diffraction & X-Ray Excitation
  • 16. X-Ray and Electron Energy-Loss Spectral Imaging
  • 17. Practical Aspects and Advanced Applications of XEDS.

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