Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings / edited by Pasi Fränti, Gavin Brown, Marco Loog, Francisco Escolano, Marcello Pelillo.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techni...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Fränti, Pasi (Editor), Brown, Gavin (Editor), Loog, Marco (Editor), Escolano, Francisco (Editor), Pelillo, Marcello (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Series:Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 8621
Springer eBook Collection.
Subjects:
Artificial intelligence.
Pattern recognition.
Application software.
Database management.
Algorithms.
Data mining.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Description
Summary:This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.
Physical Description:XX, 478 p. 124 illus. online resource.
ISBN:9783662444153
DOI:10.1007/978-3-662-44415-3

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