Ellipsometry of Functional Organic Surfaces and Films edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces,...
Full description
Saved in: