Contactless VLSI Measurement and Testing Techniques by Selahattin Sayil.

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...

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Bibliographic Details
Main Author: Sayil, Selahattin (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Series:Springer eBook Collection.
Subjects:
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.

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LEADER 00000nam a22000005i 4500
001 b3288975
003 MWH
005 20191026021719.0
007 cr nn 008mamaa
008 171116s2018 gw | s |||| 0|eng d
020 |a 9783319696737 
024 7 |a 10.1007/978-3-319-69673-7  |2 doi 
035 |a (DE-He213)978-3-319-69673-7 
050 4 |a E-Book 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
100 1 |a Sayil, Selahattin.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Contactless VLSI Measurement and Testing Techniques  |h [electronic resource] /  |c by Selahattin Sayil. 
250 |a 1st ed. 2018. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2018. 
300 |a V, 93 p. 34 illus., 11 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Springer eBook Collection 
505 0 |a 1. Conventional Test Methods. – 2. Testability Design -- 3. Other Techniques Based on the Contacting Probe -- 4. Contactless Testing -- 5. Electron-Beam and Photoemission Probing -- 6. Electro Optic Sampling and Charge Density Probe -- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe -- 8. Probing Techniques Based on Light Emission from Chip -- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits -- 10. Comparison of Contactless Testing Methodologies. 
520 |a This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test: Provides a single-source reference on contactless probing approaches for VLSI testing and diagnostic measurement Introduces readers to various optical contactless testing techniques, such as Electro-Optic Probing, Charge Density Probe, and Photo-emissive Probe Discusses the applicability and adaptability of each technique, based on multilayer metallization, wafer level techniques, and invasiveness Provides a comparison among various contactless testing techniques Describes a variety of industrial applications of contactless VLSI testing. 
590 |a Loaded electronically. 
590 |a Electronic access restricted to members of the Holy Cross Community. 
650 0 |a Electronic circuits. 
650 0 |a Microprocessors. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
690 |a Electronic resources (E-books) 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
830 0 |a Springer eBook Collection. 
856 4 0 |u https://holycross.idm.oclc.org/login?auth=cas&url=https://doi.org/10.1007/978-3-319-69673-7  |3 Click to view e-book  |t 0 
907 |a .b32889756  |b 04-18-22  |c 02-26-20 
998 |a he  |b 02-26-20  |c m  |d @   |e -  |f eng  |g gw   |h 0  |i 1 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647) 
902 |a springer purchased ebooks 
903 |a SEB-COLL 
945 |f  - -   |g 1  |h 0  |j  - -   |k  - -   |l he   |o -  |p $0.00  |q -  |r -  |s b   |t 38  |u 0  |v 0  |w 0  |x 0  |y .i22021371  |z 02-26-20 
999 f f |i 0d0cb088-7b88-545d-b5e8-2c5e16c4fa9c  |s cf3dc3e1-3b50-5d93-a887-c742bfc97354  |t 0 
952 f f |p Online  |a College of the Holy Cross  |b Main Campus  |c E-Resources  |d Online  |t 0  |e E-Book  |h Library of Congress classification  |i Elec File