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|a 10.1007/978-3-662-53227-0
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|a Resonant X-Ray Scattering in Correlated Systems
|h [electronic resource] /
|c edited by Youichi Murakami, Sumio Ishihara.
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|a 1st ed. 2017.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2017.
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|a VII, 241 p. 151 illus., 25 illus. in color.
|b online resource.
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|a Springer Tracts in Modern Physics,
|x 0081-3869 ;
|v 269
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|a Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara) -- Resonant X-ray scattering in 3d electron systems (H. Nakao) -- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura) -- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima) -- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati) -- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).
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|a The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
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|a Loaded electronically.
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|a Electronic access restricted to members of the Holy Cross Community.
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|a Condensed matter.
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|a Materials science.
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|a Spectroscopy.
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|a Nanotechnology.
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|a Murakami, Youichi.
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|a Ishihara, Sumio.
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