Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces / edited by Sascha Sadewasser, Thilo Glatzel.

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Sadewasser, Sascha (Editor), Glatzel, Thilo (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
Edition:1st ed. 2012.
Series:Springer Series in Surface Sciences, 48
Springer eBook Collection.
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Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Description
Summary:In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Physical Description:XIV, 334 p. online resource.
ISBN:9783642225666
ISSN:0931-5195 ;
DOI:10.1007/978-3-642-22566-6