Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces / edited by Sascha Sadewasser, Thilo Glatzel.
In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...
Full description
Saved in: