Analog IC Reliability in Nanometer CMOS

Analog IC Reliability in Nanometer CMOS by Elie Maricau, Georges Gielen.

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit r...

Full description

Saved in:
Bibliographic Details
Main Authors: Maricau, Elie (Author), Gielen, Georges (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:Analog Circuits and Signal Processing,
Springer eBook Collection.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Nanotechnology.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Login for hold information

‌

Click to view e-book

Online

Holdings details from Online
Call Number: E-Book
Copy 1 Available

Similar Items