Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms / by Amir Zjajo.

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

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Bibliographic Details
Main Author: Zjajo, Amir (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
Edition:1st ed. 2014.
Series:Springer Series in Advanced Microelectronics, 48
Springer eBook Collection.
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Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.

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