Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy

Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy / by K. C. Khulbe, C. Y. Feng, Takeshi Matsuura.

Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on...

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Bibliographic Details
Main Authors: Khulbe, K. C. (Author), Feng, C. Y. (Author), Matsuura, Takeshi (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Springer Laboratory, Manuals in Polymer Science,
Springer eBook Collection.
Subjects:
Polymers  .
Chemical engineering.
Medicine.
Analytical chemistry.
Food—Biotechnology.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • Synthetic Membranes for Membrane Processes
  • Atomic Force Microscopy
  • Nodular Structure of Polymers in the Membrane
  • Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
  • Cross-sectional AFM Image
  • Adhesion
  • Membrane Surface Morphology and Membrane Performance.

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