Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction

Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction / by Arief Suriadi Budiman.

This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystall...

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Bibliographic Details
Main Author: Budiman, Arief Suriadi (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Singapore : Springer Singapore : Imprint: Springer, 2015.
Edition:1st ed. 2015.
Series:SpringerBriefs in Applied Sciences and Technology,
Springer eBook Collection.
Subjects:
Materials science.
Nanotechnology.
Crystallography.
Spectroscopy.
Microscopy.
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • From the Contents: Introduction
  • Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab
  • Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.

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