Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James Howe.

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...

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Bibliographic Details
Main Authors: Fultz, Brent (Author), Howe, James (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edition:4th ed. 2013.
Series:Graduate Texts in Physics,
Springer eBook Collection.
Subjects:
Spectroscopy.
Microscopy.
Materials science.
Materials—Surfaces.
Thin films.
Surfaces (Physics).
Interfaces (Physical sciences).
Electronic resources (E-books)
Online Access:Click to view e-book
Holy Cross Note:Loaded electronically.
Electronic access restricted to members of the Holy Cross Community.
Table of Contents:
  • Diffraction and X-Ray Powder Diffractometer Problems
  • TEM and its Optics Problems
  • Neutron Scattering Problems
  • Scattering Problems
  • Inelastic Electron Scattering and Spectroscopy Problems
  • Diffraction from Crystals Sphere Problems
  • Electron Diffraction and Crystallography Problems
  • Diffraction Contrast in TEM Images Problems
  • Diffraction Lineshapes Problems
  • Patterson Functions and Diffuse Scattering Problems
  • High-Resolution TEM Imaging Problems
  • High-Resolution STEM and Related Imaging Techniques Problems
  • Dynamical Theory Problems.

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