X-ray scattering from semiconductors

X-ray scattering from semiconductors / Paul F. Fewster.

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...

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Bibliographic Details
Main Author: Fewster, Paul F.
Format: eBook
Language:English
Published: London : Imperial College Press, ©2003.
Edition:2nd ed.
Subjects:
X-rays > Scattering.
Semiconductors.
x-ray scattering.
semiconductor.
SCIENCE > Physics > Nuclear.
SCIENCE > Physics > Atomic & Molecular.
Semiconductors
X-rays > Scattering
Online Access:Click for online access
Description
Summary:This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.
Physical Description:1 online resource (xiv, 299 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:1860944582
9781860944581
Source of Description, Etc. Note:Print version record.

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