X-ray scattering from semiconductors

X-ray scattering from semiconductors / Paul F. Fewster.

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...

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Bibliographic Details
Main Author: Fewster, Paul F.
Format: eBook
Language:English
Published: London : Imperial College Press, ©2003.
Edition:2nd ed.
Subjects:
X-rays > Scattering.
Semiconductors.
x-ray scattering.
semiconductor.
SCIENCE > Physics > Nuclear.
SCIENCE > Physics > Atomic & Molecular.
Semiconductors
X-rays > Scattering
Online Access:Click for online access
Table of Contents:
  • Copyright; Preface; Contents; 1
  • An Introduction to Semiconductor Materials; 2
  • An Introduction to X-Ray Scattering; 3
  • Equipment for Measuring Diffraction Patterns; 4
  • A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index.

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