Characterization of high Tc materials and devices by electron microscopy

Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook.

This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...

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Bibliographic Details
Other Authors: Browning, Nigel D., Pennycook, Stephen J.
Format: eBook
Language:English
Published: Cambridge ; New York : Cambridge University Press, 2000.
Subjects:
High temperature superconductors.
Electron microscopy > Technique.
TECHNOLOGY & ENGINEERING > Superconductors & Superconductivity.
Electron microscopy > Technique
High temperature superconductors
Elektronenmikroskopie
Hochtemperatursupraleiter
Online Access:Click for online access
Description
Summary:This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
Physical Description:1 online resource (xii, 391 pages) : illustrations
Bibliography:Includes bibliographical references.
ISBN:0511039662
9780511039669
9780511534829
0511534825
9780511038150
0511038151
9786610417018
6610417016
1107113016
9781107113015
1280417013
9781280417016
0511175078
9780511175077
0511155174
9780511155178
0511328664
9780511328664
9780521031707
0521031702
Language:English.
Source of Description, Etc. Note:Print version record.

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