Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook.

This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...

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Bibliographic Details
Other Authors: Browning, Nigel D., Pennycook, Stephen J.
Format: eBook
Language:English
Published: Cambridge ; New York : Cambridge University Press, 2000.
Subjects:
Online Access:Click for online access
Table of Contents:
  • Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors.