Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing / Jack W. Ekin.

Aimed at a broad readership across applied science, this illustrated text builds a consistent, self-supporting knowledge base of low-temperature apparatus design. Many recent developments in measurement techniques, superconductors, and scaling theory not previously published are covered.

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Bibliographic Details
Main Author: Ekin, J. W.
Format: eBook
Language:English
Published: Oxford ; New York : Oxford University Press, 2006.
Subjects:
Online Access:Click for online access

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100 1 |a Ekin, J. W. 
245 1 0 |a Experimental techniques for low-temperature measurements :  |b cryostat design, material properties, and superconductor critical-current testing /  |c Jack W. Ekin. 
260 |a Oxford ;  |a New York :  |b Oxford University Press,  |c 2006. 
300 |a 1 online resource (xxviii, 673 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a data file 
504 |a Includes bibliographical references and index. 
520 8 |a Aimed at a broad readership across applied science, this illustrated text builds a consistent, self-supporting knowledge base of low-temperature apparatus design. Many recent developments in measurement techniques, superconductors, and scaling theory not previously published are covered. 
505 0 |a SYMBOLS AND ABBREVIATIONS; ACKNOWLEDGMENTS; ABOUT THE AUTHOR; CONTACT INFORMATION; DISCLAIMER; PART I: CRYOSTAT DESIGN AND MATERIALS SELECTION; 1 Introduction to Measurement Cryostats and Cooling Methods; 1.1 Introduction; 1.2 Cryogenic liquids; 1.3 Introduction to measurement cryostats; 1.4 Examples of measurement cryostats and cooling methods-low transport current ((omitted) 1 A); 1.5 Examples of measurement cryostats and cooling methods-high transport current ((omitted) 1 A); 1.6 Addenda: safety and cryogen handling; 1.7 References; 2 Heat Transfer at Cryogenic Temperatures 
505 8 |a 2.1 Introduction2.2 Heat conduction through solids; 2.3 Heat conduction through gases (and liquids); 2.4 Radiative heat transfer; 2.5 Heat conduction across liquid/solid interfaces; 2.6 Heat conduction across solid/solid interfaces; 2.7 Heat conduction across solid/gas interfaces; 2.8 Other heat sources; 2.9 Examples of heat-transfer calculation; 2.10 References; 3 Cryostat Construction; 3.1 Introduction; 3.2 Material selection for cryostat parts; 3.3 Joining techniques; 3.4 Construction example for a basic dipper probe; 3.5 Sizing of parts for mechanical strength 
505 8 |a 3.6 Mechanical motion at cryogenic temperature3.7 Vacuum techniques and seals for cryogenic use; 3.8 Addenda: high and ultrahigh vacuum techniques; 3.9 References; 4 Wiring and Connections; 4.1 Introduction; 4.2 Wire selection; 4.3 Insulation selection; 4.4 Heat sinks for instrumentation leads; 4.5 Solder connections; 4.6 Sensitive dc voltage leads: techniques for minimizing thermoelectric voltages; 4.7 Vacuum electrical lead-throughs; 4.8 Radio-frequency coaxial cables; 4.9 High-current leads; 4.10 Flexible current leads; 4.11 References; 5 Temperature Measurement and Control 
505 8 |a 5.1 Thermometer selection (1-300 K)5.2 Selection of thermometers for use in high magnetic fields; 5.3 Thermometer installation and measurement procedures; 5.4 Controlling temperature; 5.5 Addendum: reference compendium of cryogenic-thermometer properties and application techniques; 5.6 References; 6 Properties of Solids at Low Temperatures; 6.1 Specific heat and thermal diffusivity; 6.2 Thermal expansion/contraction; 6.3 Electrical resistivity; 6.4 Thermal conductivity; 6.5 Magnetic susceptibility; 6.6 Mechanical properties; 6.7 References 
505 8 |a PART II: ELECTRICAL TRANSPORT MEASUREMENTS: SAMPLE HOLDERS AND CONTACTS7 Sample Holders; 7.1 General principles for sample-holder design; 7.2 Four-lead and two-lead electrical transport measurements; 7.3 Bulk sample holders; 7.4 Thin-film sample holders; 7.5 Addenda; 7.6 References; 8 Sample Contacts; 8.1 Introduction; 8.2 Definition of specific contact resistivity and values for practical applications; 8.3 Contact techniques for high-current superconductors; 8.4 Contact techniques for film superconductors; 8.5 Example calculations of minimum contact area 
546 |a English. 
650 0 |a Low temperatures  |x Measurement. 
650 0 |a Low temperatures  |x Instruments. 
650 0 |a Low temperature research. 
650 0 |a Superconductors. 
650 7 |a superconductor.  |2 aat 
650 7 |a SCIENCE  |x Mechanics  |x Thermodynamics.  |2 bisacsh 
650 7 |a Low temperature research  |2 fast 
650 7 |a Low temperatures  |x Instruments  |2 fast 
650 7 |a Low temperatures  |x Measurement  |2 fast 
650 7 |a Superconductors  |2 fast 
758 |i has work:  |a Experimental techniques for low-temperature measurements (Text)  |1 https://id.oclc.org/worldcat/entity/E39PCFRPCvp7fV49QhtqQMtRDm  |4 https://id.oclc.org/worldcat/ontology/hasWork 
776 0 8 |i Print version:  |a Ekin, J.W.  |t Experimental techniques for low-temperature measurements.  |d Oxford : Oxford University Press, 2006  |w (DLC) 2006010332 
856 4 0 |u https://holycross.idm.oclc.org/login?auth=cas&url=https://academic.oup.com/book/32506  |y Click for online access 
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