Monte Carlo modeling for electron microscopy and microanalysis

Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy.

1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and I...

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Bibliographic Details
Main Author: Joy, David C., 1943-
Format: eBook
Language:English
Published: New York : Oxford University Press, 1995.
Series:Oxford series in optical and imaging sciences ; 9.
Subjects:
Electron microscopy > Computer simulation.
Electron probe microanalysis > Computer simulation.
Monte Carlo method.
SCIENCE > Electron Microscopes & Microscopy.
Electron microscopy > Computer simulation
Electron probe microanalysis > Computer simulation
Monte Carlo method
Online Access:Click for online access
Description
Summary:1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
Physical Description:1 online resource (viii, 216 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:9780195358469
0195358465
Source of Description, Etc. Note:Print version record.

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