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00000cam a2200000 a 4500 |
| 001 |
ocn435816746 |
| 003 |
OCoLC |
| 005 |
20240909213021.0 |
| 006 |
m o d |
| 007 |
cr cnu---unuuu |
| 008 |
090904s1995 nyua ob 001 0 eng d |
| 040 |
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|a 0195358465
|q (electronic bk.)
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| 050 |
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4 |
|a QH212.E4
|b J67 1995eb
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| 072 |
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7 |
|a SCI
|x 023000
|2 bisacsh
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| 049 |
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|a HCDD
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| 100 |
1 |
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|a Joy, David C.,
|d 1943-
|1 https://id.oclc.org/worldcat/entity/E39PBJmXKKJvbkf74VyGFdxJjC
|
| 245 |
1 |
0 |
|a Monte Carlo modeling for electron microscopy and microanalysis /
|c David C. Joy.
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| 260 |
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|a New York :
|b Oxford University Press,
|c 1995.
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| 300 |
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|a 1 online resource (viii, 216 pages) :
|b illustrations
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Oxford series in optical and imaging sciences ;
|v 9
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| 504 |
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|a Includes bibliographical references and index.
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| 505 |
0 |
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|a 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index.
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| 520 |
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|a 1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
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| 588 |
0 |
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|a Print version record.
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| 650 |
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0 |
|a Electron microscopy
|x Computer simulation.
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| 650 |
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|a Electron probe microanalysis
|x Computer simulation.
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| 650 |
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|a Monte Carlo method.
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| 650 |
|
7 |
|a SCIENCE
|x Electron Microscopes & Microscopy.
|2 bisacsh
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| 650 |
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7 |
|a Electron microscopy
|x Computer simulation
|2 fast
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| 650 |
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7 |
|a Electron probe microanalysis
|x Computer simulation
|2 fast
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| 650 |
|
7 |
|a Monte Carlo method
|2 fast
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| 758 |
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|i has work:
|a Monte Carlo modeling for electron microscopy and microanalysis (Text)
|1 https://id.oclc.org/worldcat/entity/E39PCFBQwGxMyVYmdXfW49bcKb
|4 https://id.oclc.org/worldcat/ontology/hasWork
|
| 776 |
0 |
8 |
|i Print version:
|a Joy, David C., 1943-
|t Monte Carlo modeling for electron microscopy and microanalysis.
|d New York : Oxford University Press, 1995
|z 0195088743
|z 9780195088748
|w (DLC) 94035642
|w (OCoLC)31287442
|
| 830 |
|
0 |
|a Oxford series in optical and imaging sciences ;
|v 9.
|
| 856 |
4 |
0 |
|u https://ebookcentral.proquest.com/lib/holycrosscollege-ebooks/detail.action?docID=430981
|y Click for online access
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| 903 |
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|a EBC-AC
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| 994 |
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