Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy.

1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and I...

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Bibliographic Details
Main Author: Joy, David C., 1943-
Format: eBook
Language:English
Published: New York : Oxford University Press, 1995.
Series:Oxford series in optical and imaging sciences ; 9.
Subjects:
Online Access:Click for online access