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20240623213015.0 |
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130816s2013 xx ob 001 0 eng d |
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|d OCLCQ
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|a 865020858
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|a 1299775802
|q (ebk)
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|a 9781299775800
|q (ebk)
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|a 9783527670772
|q (electronic bk.)
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|a 3527670777
|q (electronic bk.)
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|a 9783527670802
|q (electronic bk.)
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|q (electronic bk.)
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|q (electronic bk.)
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|a EB00090652
|b Recorded Books
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|a (OCoLC)855907902
|z (OCoLC)865020858
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|a 508831
|b MIL
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|a TA403
|b .L433 2013
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|a HCDD
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| 100 |
1 |
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|a Leng, Y.
|q (Yang)
|1 https://id.oclc.org/worldcat/entity/E39PCjKXkTmvPcvyGmRybqmQVP
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1 |
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|a Materials Characterization :
|b Introduction to Microscopic and Spectroscopic Methods.
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| 260 |
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|b Wiley,
|c 2013.
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| 300 |
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|a 1 online resource
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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|a Print version record.
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| 504 |
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|a Includes bibliographical references and index.
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| 520 |
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|a Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text that never loses sight of its intended audience.
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|a Intro -- Materials Characterization -- Contents -- 1 Light Microscopy -- 1.1 Optical Principles -- 1.1.1 Image Formation -- 1.1.2 Resolution -- 1.1.2.1 Effective Magnification -- 1.1.2.2 Brightness and Contrast -- 1.1.3 Depth of Field -- 1.1.4 Aberrations -- 1.2 Instrumentation -- 1.2.1 Illumination System -- 1.2.2 Objective Lens and Eyepiece -- 1.2.2.1 Steps for Optimum Resolution -- 1.2.2.2 Steps to Improve Depth of Field -- 1.3 Specimen Preparation -- 1.3.1 Sectioning -- 1.3.1.1 Cutting -- 1.3.1.2 Microtomy -- 1.3.2 Mounting -- 1.3.3 Grinding and Polishing -- 1.3.3.1 Grinding
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|a 1.3.3.2 Polishing -- 1.3.4 Etching -- 1.4 Imaging Modes -- 1.4.1 Bright-Field and Dark-Field Imaging -- 1.4.2 Phase-Contrast Microscopy -- 1.4.3 Polarized-Light Microscopy -- 1.4.4 Nomarski Microscopy -- 1.4.5 Fluorescence Microscopy -- 1.5 Confocal Microscopy -- 1.5.1 Working Principles -- 1.5.2 Three-Dimensional Images -- References -- Further Reading -- 2 X-Ray Diffraction Methods -- 2.1 X-Ray Radiation -- 2.1.1 Generation of X-Rays -- 2.1.2 X-Ray Absorption -- 2.2 Theoretical Background of Diffraction -- 2.2.1 Diffraction Geometry -- 2.2.1.1 Bragg's Law -- 2.2.1.2 Reciprocal Lattice
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|a 2.2.1.3 Ewald Sphere -- 2.2.2 Diffraction Intensity -- 2.2.2.1 Structure Extinction -- 2.3 X-Ray Diffractometry -- 2.3.1 Instrumentation -- 2.3.1.1 System Aberrations -- 2.3.2 Samples and Data Acquisition -- 2.3.2.1 Sample Preparation -- 2.3.2.2 Acquisition and Treatment of Diffraction Data -- 2.3.3 Distortions of Diffraction Spectra -- 2.3.3.1 Preferential Orientation -- 2.3.3.2 Crystallite Size -- 2.3.3.3 Residual Stress -- 2.3.4 Applications -- 2.3.4.1 Crystal-Phase Identification -- 2.3.4.2 Quantitative Measurement -- 2.4 Wide-Angle X-Ray Diffraction and Scattering
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|a 2.4.1 Wide-Angle Diffraction -- 2.4.2 Wide-Angle Scattering -- References -- Further Reading -- 3 Transmission Electron Microscopy -- 3.1 Instrumentation -- 3.1.1 Electron Sources -- 3.1.1.1 Thermionic Emission Gun -- 3.1.1.2 Field Emission Gun -- 3.1.2 Electromagnetic Lenses -- 3.1.3 Specimen Stage -- 3.2 Specimen Preparation -- 3.2.1 Prethinning -- 3.2.2 Final Thinning -- 3.2.2.1 Electrolytic Thinning -- 3.2.2.2 Ion Milling -- 3.2.2.3 Ultramicrotomy -- 3.3 Image Modes -- 3.3.1 Mass-Density Contrast -- 3.3.2 Diffraction Contrast -- 3.3.3 Phase Contrast -- 3.3.3.1 Theoretical Aspects
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|a 3.3.3.2 Two-Beam and Multiple-Beam Imaging -- 3.4 Selected-Area Diffraction (SAD) -- 3.4.1 Selected-Area Diffraction Characteristics -- 3.4.2 Single-Crystal Diffraction -- 3.4.2.1 Indexing a Cubic Crystal Pattern -- 3.4.2.2 Identification of Crystal Phases -- 3.4.3 Multicrystal Diffraction -- 3.4.4 Kikuchi Lines -- 3.5 Images of Crystal Defects -- 3.5.1 Wedge Fringe -- 3.5.2 Bending Contours -- 3.5.3 Dislocations -- References -- Further Reading -- 4 Scanning Electron Microscopy -- 4.1 Instrumentation -- 4.1.1 Optical Arrangement -- 4.1.2 Signal Detection -- 4.1.2.1 Detector
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|a Materials.
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| 650 |
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|a Materials
|x Analysis.
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| 650 |
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|a TECHNOLOGY & ENGINEERING
|x Materials Science.
|2 bisacsh
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|a Materials
|2 fast
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| 650 |
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|a Materials
|x Analysis
|2 fast
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|a Electronic books.
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| 758 |
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|i has work:
|a Materials characterization (Text)
|1 https://id.oclc.org/worldcat/entity/E39PCGkvdX3WhDQgm7G7CQmRgC
|4 https://id.oclc.org/worldcat/ontology/hasWork
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| 776 |
0 |
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|i Print version:
|z 9781299775800
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| 856 |
4 |
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|u https://ebookcentral.proquest.com/lib/holycrosscollege-ebooks/detail.action?docID=7104670
|y Click for online access
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|a EBC-AC
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|a 92
|b HCD
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