High definition : zero tolerance in design and production / guest-edited by Bob Sheil.

A pioneering title, High Definition explores the onslaught of new and highly accurate digital metrology tools in large- and small-scale 3-D scanning and 3-D modelling. Capable of measuring space to an accuracy of less than 1 mm, these tools offer unprecedented precision for the development and inter...

詳細記述

保存先:
書誌詳細
第一著者: Sheil, Bob (著者)
フォーマット: eBook
言語:English
出版事項: Hoboken : John Wiley & Sons, 2014.
シリーズ:Architectural design (London, England : 1971) ; v. 84, no. 1.
Profile (Chichester, England) ; 227.
主題:
オンライン・アクセス:Click for online access