Fringe pattern analysis for optical metrology : theory, algorithms, and applications

Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Bibliographic Details
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, [2014]
Edition:First edition.
Subjects:
Interferometry.
Diffraction patterns.
Optical measurements.
SCIENCE > Energy.
SCIENCE > Mechanics > General.
SCIENCE > Physics > General.
Diffraction patterns
Interferometry
Optical measurements
Interferometrie
Beugungsfigur
Online Access:Click for online access

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