Next generation HALT and HASS : robust design of electronics and systems

Next generation HALT and HASS : robust design of electronics and systems / by Kirk Gray, John James Paschkewitz.

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-base...

Full description

Saved in:
Bibliographic Details
Main Authors: Gray, Kirk (Author), Paschkewitz, John James (Author)
Format: eBook
Language:English
Published: Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016.
Subjects:
Accelerated life testing.
Electronic systems > Design and construction.
Electronic systems > Testing.
accelerated aging.
TECHNOLOGY & ENGINEERING > Mechanical.
Accelerated life testing
Electronic systems > Design and construction
Electronic systems > Testing
Online Access:Click for online access
Login for hold information

‌

Click for online access

Online

Holdings details from Online
Status: Available

Similar Items