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| 001 |
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| 003 |
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20241006213017.0 |
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| 007 |
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170817s2017 enkado ob 001 0 eng d |
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|a N$T
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| 019 |
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|a 1024284940
|a 1031870441
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| 020 |
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|a 9781119008675
|q (electronic bk.)
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| 020 |
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|a 1119008670
|q (electronic bk.)
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| 020 |
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|a 9781119005063
|q (electronic bk.)
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| 020 |
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|a 111900506X
|q (electronic bk.)
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| 020 |
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|z 9781848215771
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| 020 |
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|z 1848215770
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| 035 |
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|a (OCoLC)1001287930
|z (OCoLC)1024284940
|z (OCoLC)1031870441
|
| 050 |
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4 |
|a QC702.7.B65
|
| 072 |
|
7 |
|a SCI
|x 057000
|2 bisacsh
|
| 049 |
|
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|a HCDD
|
| 100 |
1 |
|
|a Jalabert, Denis,
|e author.
|
| 245 |
1 |
0 |
|a Swift ion beam analysis in nanosciences /
|c Denis Jalabert, Ian Vickridge, Amal Chabli.
|
| 264 |
|
1 |
|a London, UK :
|b ISTE, Ltd. ;
|a Hoboken, NJ :
|b Wiley,
|c 2017.
|
| 300 |
|
|
|a 1 online resource
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 490 |
1 |
|
|a Nanoscience and nanotechnology series
|
| 504 |
|
|
|a Includes list of acronyms, bibliographical references (pages 237-255), and index.
|
| 505 |
0 |
0 |
|t Introduction --
|t Fundamentals of ion-solid interactions with a focus on the nanoscale ;
|t General considerations ;
|t Basic physical concepts ;
|t Channeling, shadowing and blocking ;
|t 1D layers : limits to depth resolution ;
|t 2D and 3D objects : aspects of lateral resolution --
|t Instruments and methods ;
|t Instruments ;
|t Methods --
|t Applications ;
|t Example of resonances/light element profiling ;
|t Quantitative analysis/heavy element profiling ;
|t Examples of HR-ERD analysis ;
|t Channeling/defect profiling ;
|t Blocking/strain profiling ;
|t 3D MEIS/real space structural analysis --
|t The place of nanoIBA in the characterization forest ;
|t Introduction ;
|t Scope of physical and chemical characterization ;
|t Ion-based characterization techniques overview ;
|t Ion-mass-spectroscopy-based characterization techniques versus IBA ;
|t Other characterization techniques versus IBA ;
|t Emerging ion-beam-based techniques.
|
| 520 |
|
|
|a Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods. -- ISTE, Ltd. website.
|
| 588 |
0 |
|
|a Online resource; title from PDF title page (Ebsco, viewed August 29, 2017).
|
| 650 |
|
0 |
|a Ion bombardment
|x Industrial applications.
|
| 650 |
|
0 |
|a Nanotechnology.
|
| 650 |
|
7 |
|a SCIENCE
|x Physics
|x Quantum Theory.
|2 bisacsh
|
| 650 |
|
7 |
|a Ion bombardment
|x Industrial applications
|2 fast
|
| 650 |
|
7 |
|a Nanotechnology
|2 fast
|
| 700 |
1 |
|
|a Vickridge, Ian,
|d 1958-
|e author.
|1 https://id.oclc.org/worldcat/entity/E39PCjtMr646gyyYc773Hmy9j3
|
| 700 |
1 |
|
|a Chabli, Amal,
|e author.
|
| 758 |
|
|
|i has work:
|a Swift ion beam analysis in nanosciences (Text)
|1 https://id.oclc.org/worldcat/entity/E39PCH6qRQ87XXkXHTKCffJkXd
|4 https://id.oclc.org/worldcat/ontology/hasWork
|
| 830 |
|
0 |
|a RSC nanoscience & nanotechnology.
|
| 856 |
4 |
0 |
|u https://ebookcentral.proquest.com/lib/holycrosscollege-ebooks/detail.action?docID=4983681
|y Click for online access
|
| 903 |
|
|
|a EBC-AC
|
| 994 |
|
|
|a 92
|b HCD
|