Swift ion beam analysis in nanosciences / Denis Jalabert, Ian Vickridge, Amal Chabli.
Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introdu...
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Bibliographic Details
| Main Authors: |
Jalabert, Denis
(Author),
Vickridge, Ian, 1958-
(Author),
Chabli, Amal
(Author) |
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| Format: | eBook
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| Language: | English |
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| Published: |
London, UK : Hoboken, NJ :
ISTE, Ltd. ; Wiley,
2017.
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| Series: | RSC nanoscience & nanotechnology.
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| Subjects: | |
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| Online Access: | Click for online access
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