Swift ion beam analysis in nanosciences

Swift ion beam analysis in nanosciences / Denis Jalabert, Ian Vickridge, Amal Chabli.

Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introdu...

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Bibliographic Details
Main Authors: Jalabert, Denis (Author), Vickridge, Ian, 1958- (Author), Chabli, Amal (Author)
Format: eBook
Language:English
Published: London, UK : Hoboken, NJ : ISTE, Ltd. ; Wiley, 2017.
Series:RSC nanoscience & nanotechnology.
Subjects:
Ion bombardment > Industrial applications.
Nanotechnology.
SCIENCE > Physics > Quantum Theory.
Ion bombardment > Industrial applications
Nanotechnology
Online Access:Click for online access
Table of Contents:
  • Introduction
  • Fundamentals of ion-solid interactions with a focus on the nanoscale ; General considerations ; Basic physical concepts ; Channeling, shadowing and blocking ; 1D layers : limits to depth resolution ; 2D and 3D objects : aspects of lateral resolution
  • Instruments and methods ; Instruments ; Methods
  • Applications ; Example of resonances/light element profiling ; Quantitative analysis/heavy element profiling ; Examples of HR-ERD analysis ; Channeling/defect profiling ; Blocking/strain profiling ; 3D MEIS/real space structural analysis
  • The place of nanoIBA in the characterization forest ; Introduction ; Scope of physical and chemical characterization ; Ion-based characterization techniques overview ; Ion-mass-spectroscopy-based characterization techniques versus IBA ; Other characterization techniques versus IBA ; Emerging ion-beam-based techniques.

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