Electrical Characterisation of Ferroelectric Field Effect Transistors Based on Ferroelectric HfO2 Thin Films.

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Bibliographic Details
Main Author: Yurchuk, Ekaterina
Format: eBook
Language:English
Published: Berlin : Logos Verlag Berlin, 2015.
Series:Research at NaMLab Ser.
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Online Access:Click for online access
Description
Summary:Annotation
Physical Description:1 online resource (186 pages).
Bibliography:Includes bibliographical references.
ISBN:9783832594787
3832594787
Source of Description, Etc. Note:Print version record.